Transmission Electron Microscopy (TEM) in Nano
TEM is a crucial tool for characterizing nanomaterials, providing detailed images of morphology, particle size, and crystallinity at the atomic scale.
It allows scientists to visualize the nanoscale, revealing structural topography with ultra precision, and exposing features such as smooth planes and defects.
TEM reveals structural topography with ultra precision, exposing everything from smooth planes to unwanted defects.
TEM uses a focused beam of electrons to image material surfaces, allowing for the visualization of individual atoms, lattice arrangements, and structural defects.
- Accelerates electrons with energies between 80 and 300 kV
- Directs electrons through a thin specimen for transmission
Author's summary: TEM is a key tool for nanomaterials characterization.